Memsic, Inc., manufacturer of advanced Mems micro-electromechanical accelerometers and inertial sensors, has announced the availability of plaques that are precisely designed for the evaluation of Memsic sensors.
Currently three demo cards versions are available for the MXEB-001 LJC that include a decoupling circuit, and they work as simple access to the test circuit. The user can connect quickly, through "edge fingers", to a feeder to evaluate MXI0I0 devices both in T0I00 packs and in LCC.

This card can also be used as reference in applications. MXEB-S-001 includes: a decoupling circuit; an external amplifier; a PWM converter, as well as a base for LCC-8 and TO-I 00 packs, allowing fast transfers in the evaluation of multiple devices.

With a feeder and an oscilloscope, the user can evaluate, quickly, many aspects of the MXI 010 sensor. The MXEB-TP-00I is designed to allow users to evaluate Memsic sensors in applications for games and in the detection of inclines, without using specific joy and switch buttons.

MXEB-232-001, recently distributed by Memsic, has the feature of being able to record data, compensating the sensitivity and the secondary variations depending on the temperature. This card also includes the software and the hardware required to evaluate the single and double axis sensors.